ADVANTEST CORPORATION : Advantest Announces Memory Test System T5811
06/04/2012| 10:15pm US/Eastern
Focus on Memory Core Test Dramatically Lowers COT
Advantest Corporation (TSE: 6857, NYSE: ATE) today announced its new
memory test system, the T5811, targeting DRAM memory core test.
Available from July 2012, the T5811 reduces power consumption by 90% and
floor-space requirements by two-thirds, compared to previous models, and
is upgradable via a simple exchange of components. The system will be
launched at Advantest's corporate exhibition, ADVANTEST EXPO 2012, to be
held on June 6th - 7th in Tokyo.
A New Solution for Commodity DRAM Test Cost Reduction
Dynamic random access memory (DRAM) is the most commonly used type of
commodity memory device for servers and client PCs, and is also used
extensively in mobile applications. Solid bit growth in DDR3-SDRAM and
DDR4-SDRAM, the dominant types of PC memory, augurs continuing market
expansion. Meanwhile, the low-power requirements of smartphones and
tablets underpin forecasts of rapidly growing demand for LPDDR2-SDRAM
and LPDDR3-SDRAM. Yet the ongoing commodification of DRAM is driving
down prices and forcing chipmakers to seek greater COT (cost of test)
savings on their volume production lines. Backend DRAM test is commonly
subdivided into memory core test and at-speed test. Advantest's new
T5811 memory test system offers a dramatic contribution to lower COT by
focusing on core test.
ETH Technology Dramatically Reduces COT
Advantest's Enhanced Test Head (ETH) technology, a proprietary BOST
configuration, holds down the cost of the tester mainframe by locating
virtually all tester functionality on the motherboard in close proximity
to the DUTs. ETH technology also enables upgradability via a simple
switch-out of the Enhanced Test Module (ETM) component, allowing users
to add functionality and improve test speed at will--contributing to
significant COT reduction in the future as well as in the present.
90% Lower Power Consumption, 2/3rds Smaller Footprint
The T5811 lowers power consumption by 90% and floor-space requirements
by two-thirds, compared to previous testers, by utilizing Advantest's
proprietary ETH technology to locate virtually all tester functionality
on the motherboard.
Simple Test Program Creation
The T5811 runs Advantest's "Future Suite" tester OS, allowing operators
to utilize the extensive library of program data created for T5xxx
series test systems, regardless of whether BOST configuration is
Memory Test System T5811
Target devices: LPDDR2/3-SDRAM, DDR3-SDRAM and
Parallel test capacity: 512 (x8 I/O)
Maximum test speed: 600MHz / 1.2Gbps
All information supplied in this release is correct at the time of
publication, but may be subject to change.
Koji Ogiso, PR/IR Section
© Business Wire 2012