ADVANTEST CORPORATION : Advantest Introduces T5511 High-Speed Memory Test System Offering Multi-functionality and Industry's Top Test Speed of 8Gbps
05/14/2012| 02:50pm US/Eastern
Recommend:
Advantest Corporation (TSE: 6857, NYSE: ATE) today announced the
availability of its next-generation high-speed DRAM test system, the
T5511. The new system, which begins shipping this month, offers the
industry's fastest test speed of 8Gbps.
T5511 High-Speed Memory Test System (Photo: Business Wire)
Diverse DRAMs, One Test Solution
Dynamic random access memory (DRAM) is the most commonly used type of
commodity memory device for personal computers and workstations. It is
also widely employed in servers and clients, and used extensively in
graphics and mobile applications. Though ubiquitous, the pace of DRAM
technology changes and advances quite quickly; there is a high degree of
variation - in speed and function - between the application classes. The
ultra-fast GDDR5-SDRAM chips used for graphics need functions such as
clock training and CRC (cyclic redundancy check) to ensure their
reliability and high-speed performance. Meanwhile, DDR4-SDRAM for
servers and clients will soon achieve twice the bandwidth of mainstream
DDR3-SDRAM and functionality equal to GDDR5. In the mobile and graphics
segments, bus widths of x32 and x64 are now mainstream, and Wide I/O
DRAMs with a 256-bit wide interface are expected to be standardized in
the near future. The diverse requirement from the final application, the
development in DRAM technology requires optimal test solutions that can
support each new device generation and application, while cost-control
imperatives demand a single-platform solution supporting various types
of DRAM, which can be flexibly deployed from R&D through to volume
production.
Product Features
Industry-best 8Gbps test speed and timing accuracy of ±40ps
With a maximum test speed of 8Gbps, the T5511 is the world's fastest
memory testers, supporting the very fastest GDDR5-SDRAM devices with
capacity to spare. Furthermore, since all the system's test pins support
8Gbps, no reduction in parallelism occurs when operating at high speed.
Built-in clock training control functionality
Essential for new DDR4-SDRAM and GDDR5-SDRAM device test, clock training
functionality is built into the T5511's hardware. This allows throughput
improvements impossible when relying on software for this function.
Simpler test program creation
The T5511 also features a hardware CRC code generator function,
necessary for cutting-edge DDR4-SDRAM and GDDR5-SDRAM device test. The
dedicated hardware generates CRC codes automatically, reducing the
burden on the operator and making it simpler to create test programs.
Additionally, the T5511 runs Advantest's "Future Suite" tester OS,
allowing operators to utilize the extensive library of program data
created for T55xx series test systems.
"Lab to fab" flexibility
System configurations range from 384 pins for R&D use through to a
maximum of 6,144 pins for volume production. The T5511's "lab to fab"
flexible configurability allows customers to hold capital investment to
a minimum, while achieving maximum test efficiency.
|
Key Specifications
|
|
|
|
|
|
|
Target devices:
|
|
|
|
|
DDR4-SDRAM, GDDR5-SDRAM
|
|
Parallel test capacity:
|
|
|
|
|
256 (x8 I/O)
|
|
Maximum test speed:
|
|
|
|
|
4GHz / 8Gbps
|
|
|
|
|
|
|
|
|
Further Inquiries
|
|
|
|
|
|
|
Strategic Business Unit, Global Marketing
|
|
tel: +81-276-70-3300
|
Photos/Multimedia Gallery Available: http://www.businesswire.com/cgi-bin/mmg.cgi?eid=50277047&lang=en
Advantest Corporation
Koji Ogiso, PR/IR Section
03-3214-7500
© Business Wire 2012
Recommend :
