We're proud to offer a wide selection of discrete analytical probes to meet the highly demanding and broad range of on-wafer and signal integrity applications. Our family of RF, mixed-signal and DC probes are designed to meet the many challenges of various probing environments and provide a durable, high-performance product that exceeds expectations.

Here's a quick rundown of our family of probes and the applications they are best suited for:

1. Infinity Probe®

The Infinity Probe is an ideal match for device characterization, modeling and differential applications with industry-leading performance. The Infinity Probe provides unmatched performance in both single-signal and dual-signal (differential) applications, providing extremely low contact resistance on aluminum pads with unsurpassed RF measurement accuracy for highly reliable, repeatable measurements. The Infinity Probe is designed for on-wafer/planar surface work only. Proprietary thin-film and coaxial probe technology reduces unwanted couplings to nearby devices and transmission modes.

2. T-Wave™ Probe

The T-Wave Probes enable wafer-level electrical measurement of devices and materials up to 1.1 THz, setting the industry performance standard for characterization of millimeter and sub-millimeter wavelength devices. The T-Wave Probes deliver low insertion loss and low contact resistance when probing gold pads.

3. Air Coplanar Probe

The Air Coplanar Probe (ACP) is a rugged microwave probe with a compliant tip for accurate, repeatable measurements for both on-wafer and signal integrity applications. It features excellent probe-tip visibility and good performance. Configurations for both single and dual signal applications are available.

4. |Z| Probe®

The |Z| Probes assure long probe lifetime and accurate measurements with superior tip compliance. The RF/Microwave signal makes only one transition to the coplanar contact structure within the shielded, air-isolated probe body maintaining signal integrity over a temperature range from 10 K to 300°C.

5. RFIC and Functional Test (multi-contact) Probes

We offer a variety of durable, high-performance mixed-signal multi-contact probes to streamline RFIC engineering test and production applications up to 110 GHz. The multi-contact probe family include InfinityQuad™ probe, Multi |Z| Probe, Unity Probe™, ACP RF quadrant probe, Eye-Pass® probe, DCQ and WPH probes.

6. Board Test and Signal Integrity Probes

We offer precision, durable fine-pitch probes, ideal for signal integrity probing on IC packages and circuit board work. Many of these probes allow for deep reach capabilities to access contacts over adjacent components. Probes are available to meet the performance requirements of both circuit work and material characterization.

7. Special-Purpose RF/Microwave Probes

We offer many custom probes, so if an exact match is not found in this guide, please contact us for a review to determine if we have a probe that will fit your requirements or if we can customize a probe to fit your application. Some example applications/probes are:

a. Impedance matching probe
b. High-performance quadrant probe
c. Cryogenic probe

To help you determine which probe is the right one for you, we've created theProbe Selection Guide. Of course, you can always reach out to us, and a local probe expert can assist you with any need you may have.

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