Cascade Microtech : Join us in Germany at ESREF September 19 – 22

Please join us at the European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF). ESREF focuses on recent developments and future directions in quality and reliability management of materials, devices and circuits for micro-, nano- and opto-electronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications. This is the 27 ESREF gathering and we hope to see you there.

The Symposium will be held at Händel-Halle, Halle (Saale), Germany and we will be in booth 21. We'll be announcing the Estrada™ turnkey wafer-level reliability (WLR) test system for electromigration (EM) that accelerates reliability evaluation of integrated circuit interconnect technologies. This wafer-level implementation of conventional EM test provides a practical means of bypassing the packaging step required for traditional package-level reliability (PLR), yielding faster results which correlate well to baseline PLR data. Estrada-EM comprehensive WLR test cells for 300 mm wafers are designed specifically to meet the unique challenges of EM WLR requirements, such as very high temperatures and prevention of copper oxidation. These inclusive, pre-validated configurations simplify specifying, deploying, and supporting WLR EM.

Estrada-EM systems marry the industry's gold standard for engineering probe stations (including innovative, patented PureZone™ nanochamber technology for oxygen-free testing) with a proven fast parallel reliability test system and high-performance probe cards. Get fast results, superior data integrity, and unmatched reliability with Estrada-EM system.

See you in Germany at the Symposium!