Release of New Cross-section Polishers (CP) - Cross Section Sample Fabrication Equipment IB-19510CP, IB-19500CP -

JEOL Ltd. (President Gon-emon Kurihara) is pleased to announce the start of sales of new cross section polisher (CP) models as of October 2014.

Product development background

The cross section polisher (CP) is a device to prepare cross-sectional sample slices for use with a scanning electron microscope (SEM), electron probe micro analyzers (EPMA) and Auger microprobes.
For more than 10 years these systems have been sold as ground-breaking tools that allow cross sections to be prepared of specimens that are difficult to process using mechanical polishing methods, without the need for extensive skill and experience. Customers throughout the world are utilizing such instruments in many industries and fields.

During this time, these instruments came to be used not just for metals and semiconductors, but also for a diverse range of applications, including resins and new materials, and we received requests for even shorter processing times and higher throughput. 

These new products, IB-19510CP and IB-19500CP are designed to meet these market needs, and offer the performance and functions to handle sample processing in a wide range of fields.

Main Features
  1. The High-speed ion source and Quick Start function deliver even higher throughput 
    A shorter stabilization time means milling can be started in as little as about 6 minutes.
    The new ion source providing high-speed million (500 μm/h) delivers high-throughput.
  2. An intermittent milling mode enables reduction of heating effects
    Being able to set suitable parameters for each material makes it possible to handle a diverse range of specimens, and to reduce the effects of heating of the specimen. 
  3. High quality sections can be achieved with the finishing process
    After the high-speed milling, a low speed finishing is performed to produce high quality cross sections
  4. High quality carbon coatings also available (option)
    Utilizing an ion beam sputtering method allows you to obtain a dense vapor deposition coating with good granularity.
  5. Real-time monitoring of the cross-sectioning process (IB-19510CP)
    You can check the milling progress and range, without having to wait until the process is completed.

These evolved CP systems provide the solution for an even broader range of purposes and samples.

IB-19510CP

Annual unit sales target

130 units / year

JEOL Ltd.
JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.

For more information about JEOL Ltd. or any JEOL products, visit www.jeol.com.

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