"Microscopy and Analysis" Website (in Editorial page) publishes an article (titled "Extreme Microscopy") on Professor Peter Nellist of University of Oxford, a JEOL TEM customer. 2015/07/16

"Microscopy and Analysis", a world-renowned scientific journal, featured Professor Peter Nellist of University of Oxford on June 25, 2015 on its website. The article titled "Extreme Microscopy" introduces his outstanding research carriers using TEMs. Especially in the section of "Homing in on applications", development of advanced STEM-based methods to image and analyze various materials at atomic resolution, which is being implemented through a close collaboration with JEOL, is described. Professor Nellist also contributed an article to JEOL News (Vol. 50, No. 1) issued on July 3, 2015, in which his latest research achievements with JEOL 200 kV TEMs are presented.

Link to the website of Microscopy and Analysis (Editorial page) (June 25, 2015)
http://www.microscopy-analysis.com/editorials/editorial-listings/professor-peter-nellist-extreme-microscopy

*This article was supplied by kind permission of Microscopy and Analysis.

Peter Nellist

Ph. D. in Physics
Professor of University of Oxford (Department of Materials)
Appointed as President of Royal Microscopical Society in 2013.
Awarded the Burton Medal by the Microscopy Society of America for his exceptional contribution to microscopy in 2007.



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