JEOL : One term has been modified in the Glossary of TEM Terms (Figures have been added).

Author

Michiyoshi Tanaka
Professor Emeritus at Tohoku University

Co-author for English version

JEOL Ltd.

Preface

'Glossary of TEM Terms' aims to assist understanding of the basic technical terms of Microscopy, Diffractometry and Spectroscopy of the transmission electron microscope (TEM) field. The glossary consists of approximately 750 terms, which have been selected from theoretical, instrumental, crystallographic terms, specimen preparation, image processing, etc., in consideration of recent developments in the field of TEM. We have strived for clear and unambiguous descriptions with an easy-to-understand manner without using mathematics. For the terms that are used also in other scientific fields, we focus the explanations in conformity with TEM. No use of mathematics might cause a difficulty in understanding the terms in some cases. For further comprehension, reference to textbooks or corresponding literatures is recommended. We have been continuing improvement of the Glossary. We hope this Glossary of TEM Terms helpful for TEM users.

Acknowledgments

Masami Terauchi (Professor of IMRAM, Tohoku University), Kenji Tsuda (Professor of Frontier Research Institute for Interdisciplinary Sciences, Tohoku University), Koh Saitoh (Professor of Department of Crystalline Materials Science, Graduate school of Engineering, Nagoya University) and Staff of Technical Development Department, EM Business Unit at JEOL Ltd. Many other scientists and engineers are also acknowledged.