JEOL Ltd. (President Gon-emon Kurihara) announces the release of the JSM-7610FPlus, which is an upgraded model of the ultrahigh resolution Schottky field emission scanning electron microscope JSM-7610F, to be released in September 2017.

Scanning electron microscopes are used in a wide range of fields, such as nanotechnology, metallurgy, semiconductors, ceramics, medicine, and biology. As advanced materials feature an increasingly smaller, finer structure, scientists are in need of ultrahigh resolution imaging as well as analysis of the advanced materials. To meet these demands, the highly regarded JSM-7610F was upgraded to achieve higher resolution imaging through an improved electron optical system. As a result, the JSM-7610FPlus has been debuted.
The JSM-7610FPlus successfully combines ultrahigh resolution imaging and high spatial resolution analysis, with an efficient combination of the semi-in-lens objective lens and the in-lens Schottky field emission electron gun providing a large probe current with high stability.

Jeol Ltd. published this content on 06 September 2017 and is solely responsible for the information contained herein.
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