JEOL : Seven terms have been modified in the Glossary of TEM Terms (Figures have been added).
October 04, 2016 at 09:14 pm EDT
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Glossary of TEM Terms
Author Michiyoshi Tanaka
Professor Emeritus at Tohoku University Co-author for English version JEOL Ltd. Acknowledgments Masami Terauchi (Professor of IMRAM, Tohoku University), Kenji Tsuda (Associate Professor of IMRAM, Tohoku University), Koh Saitoh (Associate Professor of Ecotopia Science Institute, Nagoya University) and Staff of Technical Development Department, EM Business Unit at JEOL Ltd. Many other scientists and engineers are also acknowledged.
Terms are added or updated
July 25, 2016
de-scan
July 25, 2016
direct electron detector
July 25, 2016
precession electron diffraction
May 09, 2016
diffractogram tableau
May 09, 2016
Ronchigram
April 21, 2016
optical diffraction method
February 18, 2016
high-angle annular dark-field scanning transmission electron microscopy
February 18, 2016
low-angle annular dark-field scanning transmission electron microscopy
February 18, 2016
live time scan
February 18, 2016
differential phase contrast imaging
Jeol Ltd. published this content on 05 October 2016 and is solely responsible for the information contained herein. Distributed by Public, unedited and unaltered, on 05 October 2016 01:14:07 UTC.
Original documenthttp://www.jeol.co.jp/en/words/emterms/
Public permalinkhttp://www.publicnow.com/view/329474E73C1A1045574CED1C6ABE24E35D982B72
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