NI (Nasdaq: NATI), the provider of platform-based systems that enable
engineers and scientists to solve the world’s greatest engineering
challenges, announced today the NI
PXIe-4135 source measure unit (SMU) with a measurement sensitivity
of 10 fA and voltage output up to 200 V. Engineers can use the NI
PXIe-4135 SMU to measure low-current signals and take advantage of the
high channel density, fast test throughput and flexibility of NI PXI
SMUs for applications such as wafer-level parametric test, materials
research and characterization of low-current sensors and ICs.
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The NI PXIe-4135 source measure unit (SMU) has a measurement sensitivity of 10 fA and voltage output up to 200 V. This SMU can be used to measure low-current signals and take advantage of the high channel density, fast test throughput and flexibility of NI PXI SMUs for applications such as wafer-level parametric test, materials research and characterization of low-current sensors and ICs. (Photo: Business Wire)
“Our in-line parametric tests require us to acquire millions of data
points, often with leakage current in the picoampere range,” said Dr.
Bart De Wachter, researcher at IMEC. “The new NI PXI SMU allows us to
accurately measure these low-current signals while benefiting from the
speed improvements offered by the PXI platform and the flexibility of
programming the system with LabVIEW.”
Engineers can use modular NI PXI SMUs to build parallel,
high-channel-count systems in a compact form factor and benefit from up
to 68 SMU channels in a single PXI chassis that can scale to hundreds of
channels to address wafer-level reliability and parallel test.
Additionally, users can increase test throughput by taking advantage of
a high-speed communication bus, deterministic hardware sequencing and a
digital control loop technology to custom-tune the SMU response for any
device under test. They can also control the SMU response through
software, which removes unnecessarily long wait times for SMU settling
and offers the flexibility to help minimize overshoot and oscillations
even with highly capacitive loads.
“Increasing complexity in semiconductor devices requires us to rethink
the conventional approach for research, characterization and reliability
measurements, and that’s been a key motivator for our SMU investments in
PXI,” said Luke Schreier, director of automated test at NI. “NI SMUs
reduce test time, increase channel density, and now, offer even better
measurement quality with 10 fA sensitivity.”
Delivering the ease of use expected from a box SMU, the interactive soft
front panels on NI PXI SMUs can be used for making basic measurements
and debugging automated applications. The driver features help
files, documentation and ready-to-run example programs to assist in test
code development, and includes a programming interface that works with a
variety of development environments such as C, Microsoft .NET and LabVIEW
system design software. Engineers can also use NI PXI SMUs with NI’s
TestStand test management software, simplifying the creation and
deployment of test systems in the lab or production floor.
Read this white
paper to explore ways to reduce cost of test and build a smarter
test system with NI SMUs, or see the NI PXIe-4135 SMU in action in NI’s
booth at SEMICON West (#5543, North Hall).
Since 1976, NI (www.ni.com)
has made it possible for engineers and scientists to solve the world’s
greatest engineering challenges with powerful platform-based systems
that accelerate productivity and drive rapid innovation. Customers from
a wide variety of industries – from healthcare to automotive and from
consumer electronics to particle physics – use NI’s integrated hardware
and software platform to improve the world we live in.
LabVIEW, National Instruments, NI, ni.com and NI TestStand are
trademarks of National Instruments. Other product and company names
listed are trademarks or trade names of their respective companies.
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