Cascade Microtech : Test Challenges for Integrated Optics – COMPASS 2016 Featured Address

Ask yourself these two questions:

1. Do you know the unique test challenges posed by integrated optics and, in particular, silicon photonics?
2. Ever wonder what type of test platforms are going to be required as the industry moves toward building large-scale integrated photonic devices and how to address related test challenges?

On the second day of COMPASS 2016 Michael Hochberg, Director of Research and Development at Coriant, will share the challenges associated with driving down test costs and improving yields, and will provide an overview of the state of photonic and optoelectronic testing today. Integrated optics, and in particular silicon photonics, poses unique test challenges. As the industry moves toward building large-scale integrated photonic devices, a very rapid evolution of the relevant test platforms is going to be required.

In addition to Silicon Photonics, COMPASS 2016 will feature many topics, including:

• Probing and calibration techniques at 500 GHz and beyond
• Over-temperature measurements
• High-current/voltage device test at the wafer-level
• Probe-to-Pad Alignment (PTPA)

COMPASS 2016 is a forum for learning, where leading experts will share their knowledge on the latest techniques to improve your test and measurements outcomes…from the lab to the fab.

Register today to make sure you can take advantage of this opportunity to interact with engineers who have overcome many of the test and measurement challenges you are facing today. We hope to see you October 17 - October 18 at the Hilton Hotel & Executive Tower in beautiful Portland, Oregon!

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