PHOTON TECHNOLOGY INTERNATIONAL, INC. HORIBA Scientific and AIST-NT, deployed their joint solution at Oak Ridge National Laboratory, in the US, in collaboration with the Technische Universität Chemnitz, Germany. The resulting Tip Enhanced Raman Scattering (TERS) data was recently published in an article entitled. The data presented in this publication were recorded during the installation of the equipment in Professor Sokolov's group at Oak Ridge.
The authors demonstrate the TERS chemical imaging of the individual components in a four-carbon-allotropes sample: single-wall carbon nanotubes (CNTs), graphene oxide (GO), C60 fullerenes, and an organic residue by the by the presence of corresponding characteristic Raman peaks. TERS with spatial resolution below 15 nm allowed the analysis of: Localized changes of defect concentration in graphene and graphene oxide. Organic residue adsorption on graphene and graphene oxide.
Doping and defect in carbon nanotubes and their diameter estimation.
