JEOL : Three terms have been modified in the Glossary of TEM Terms (Figures have been added).
November 13, 2016 at 07:47 pm EST
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Glossary of TEM Terms
Author Michiyoshi Tanaka
Professor Emeritus at Tohoku University Co-author for English version JEOL Ltd. Acknowledgments Masami Terauchi (Professor of IMRAM, Tohoku University), Kenji Tsuda (Associate Professor of IMRAM, Tohoku University), Koh Saitoh (Associate Professor of Ecotopia Science Institute, Nagoya University) and Staff of Technical Development Department, EM Business Unit at JEOL Ltd. Many other scientists and engineers are also acknowledged.
Terms are added or updated
November 11, 2016
ultra-high voltage electron microscope
November 11, 2016
Fresnel fringes
November 11, 2016
quasicrystal
October 05, 2016
ice embedding
October 05, 2016
scattering contrast
October 05, 2016
diffraction contrast
October 05, 2016
phase contrast
October 05, 2016
selected-area diffraction
October 05, 2016
Kikuchi pattern
October 05, 2016
Ewald sphere
Jeol Ltd. published this content on 11 November 2016 and is solely responsible for the information contained herein. Distributed by Public, unedited and unaltered, on 14 November 2016 00:47:05 UTC.
Original documenthttp://www.jeol.co.jp/en/words/emterms/
Public permalinkhttp://www.publicnow.com/view/36135D51DF440900CE558A345D0CD9B6722E5FEC
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