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Author Michiyoshi Tanaka
Professor Emeritus at Tohoku University Co-author for English version JEOL Ltd. Acknowledgments Masami Terauchi (Professor of IMRAM, Tohoku University), Kenji Tsuda (Associate Professor of IMRAM, Tohoku University), Koh Saitoh (Associate Professor of Ecotopia Science Institute, Nagoya University) and Staff of Technical Development Department, EM Business Unit at JEOL Ltd. Many other scientists and engineers are also acknowledged.

Terms are added or updated

November 11, 2016 ultra-high voltage electron microscope
November 11, 2016 Fresnel fringes
November 11, 2016 quasicrystal
October 05, 2016 ice embedding
October 05, 2016 scattering contrast
October 05, 2016 diffraction contrast
October 05, 2016 phase contrast
October 05, 2016 selected-area diffraction
October 05, 2016 Kikuchi pattern
October 05, 2016 Ewald sphere

Jeol Ltd. published this content on 11 November 2016 and is solely responsible for the information contained herein.
Distributed by Public, unedited and unaltered, on 14 November 2016 00:47:05 UTC.

Original documenthttp://www.jeol.co.jp/en/words/emterms/

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