JEOL Ltd. announced the release of a new scanning electron microscope (SEM), the JSM-IT700HR for unprecedentedly high throughput in August 2020. The JSM-IT700HR delivers a high resolution of 1 nm and a maximum probe current of 300 nA (15 times higher than previously), providing a wealth of observation and analysis information. A simple-to-operate user interface, the compact design accommodating a large specimen chamber, with a renewed anti-vibrational support for the main console achieve more comfortable observation and analysis than before.