JEOL Ltd. announced the development and release of a new scanning electron microscope, the JSM-IT510 series, in November 2021. Scanning electron microscopes are used in a wide range of fields, such as nanotechnology, metals, semiconductors, ceramics, medicine, and biology. In addition, SEM applications are expanding to not only basic research, but also quality control at manufacturing sites. With this, demands for faster and easier data acquisition of both SEM images and analysis results, such as energy dispersive X-ray spectroscopy spectra, are increasing. In order to meet these needs and increase throughput, it have developed the JSM-IT510 series, which further evolves the operability of its popular InTouchScope. With the new Simple SEM function, you can now leave yits daily routine to the instrument. Main Features includes The Simple SEM function allows the user to simply select the acquisition conditions and field of view for the SEM image, and then the SEM image is automatically acquired. Routine work can be made more efficient, This new detector collects both electron and photon signals providing an image with high S/N and enhanced topographic information even under a low vacuum, The integration of SEM and EDS has been further developed, and the Live Map function enables live display of the elemental map of the observation field of view, 3D images can be constructed on the spot while SEM observation is being performed to obtain unevenness and depth information, The embedded EDS system shows a real-time EDS spectrum during image observation for efficient elemental analysis, The new Stage Navigation System LS can acquire an optical image of an area fits times larger than that of conventional models (200 mm x 200 mm). This function allows the user to acquire an optical image of the observation sample and move to the desired observation field by simply clicking on the optical image, With its Zeromag function, sample navigation is even easier than ever. You can locate areas for imaging or specify analysis positions over multiple fields using an optical image or holder graphic, This supports a prompt understanding of the analysis depth (reference) for the specimen and Facilitates report generation for all data from collected SEM images to elemental analysis results in a short time.