Tera Probe Inc. Announces Consolidated and Non-Consolidated Earnings Results for the Year Ended March 31, 2015; Provides Consolidated Earnings Guidance for the First Quarter of Fiscal 2016
May 14, 2015
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Tera Probe Inc. announced consolidated and non-consolidated earnings results for the year ended March 31, 2015. For the year, on consolidated basis, the company reported net sales of ¥21,303 million, operating income of ¥1,329 million, ordinary income of ¥1,306 million and net loss of ¥477 million or ¥51.42 per basic share compared to net sales of ¥21,668 million, operating income of ¥837 million, ordinary income of ¥783 million and net income of ¥61 million or ¥6.59 per basic share a year ago period. Return on equity negative was 2.3% against return on equity of 0.3% a year ago. Cash flows from operating activities were ¥6,238 million against ¥8,178 million a year ago. Income before income taxes was ¥357.407 million against ¥312.187 million a year ago. Purchase of property, plant and equipment was ¥3,189,346,000 against ¥5,382,153,000 a year ago.
For the year, on non-consolidated basis, the company reported net sales of ¥16,632 million, operating income of ¥96 million, ordinary income of ¥60 million and net loss of ¥686 million or ¥73.92 per basic share compared to net sales of ¥16,802 million, operating income of ¥614 million, ordinary income of ¥731 million and net loss of ¥148 million or ¥16.05 per basic share a year ago period. Net assets per share were ¥2,039.46 against ¥2,097.45 per share a year ago.
The company provided consolidated earnings guidance for the first quarter of fiscal 2016. For the period, the company expects net sales of ¥5,600 million, operating income of ¥500 million, ordinary income of ¥490 million and net income of ¥300 million or ¥32.32 per basic share.
Tera Probe, Inc. is a Japan-based company mainly engaged in wafer testing, and final test consignment. The Company operates in two business segments. The Memory segment is mainly engaged in the contract wafer testing business of dynamic random access memory (DRAM) produced by semiconductor manufacturers and fabrication factories. The System Large-scale Integration (LSI) segment is principally involved in the contract wafer testing business of semiconductor products such as System on Chips (SoCs), image sensors and analogs produced by domestic and international semiconductor manufacturers and fabrication factories. This segment also operates contract final testing business.
Tera Probe Inc. Announces Consolidated and Non-Consolidated Earnings Results for the Year Ended March 31, 2015; Provides Consolidated Earnings Guidance for the First Quarter of Fiscal 2016