Faraday Technology Corporation announced the successful qualification of Faraday?s Ariel? IoT SoC with UMC?s 40nm ultra-low-power (40ULP) process. Exclusively offering the SONOS eFlash solution on UMC?s 40ULP, Faraday aims at AIoT, MCU, and smart grid projects that necessitate superior performance and low-power consumption.

Faraday?s Ariel SoC, implemented with SONOS eFlash macro, has successfully passed the reliability test with HTOL (High Temperature Operating Life Latent Failure Rate) of 1000 hours at 125°C, characterization of data retention at 125°C, and more than 100k cycles of endurance test. Through the extensive testing on real silicon under rigorous conditions, Infineon?s SONOS eFlash has been confirmed that it is a qualified eNVM solution on UMC?s 40ULP. In a strategic collaboration with UMC and Infineon, Faraday has rolled out the 40ULP SONOS eFlash ASIC turnkey service, which supports the SONOS subsystem IP, wafer manufacturing, chip packaging and testing; the SONOS subsystem IP includes eFlash controller, eFlash macro IP, complete BIST on eFlash, and additional cache functions for easy data access and control.

Customers can simplify integration efforts for SONOS eFlash and proceed with mass production by utilizing the cost-effective eNVM solution on UMC 40ULP.